X-Ray diffraction (XRD) is a quick scientific procedure utilized for stage distinguishing proof of a crystalline material and can give data on unit cell measurements 27. The XRD of 20wt% TiB2 added Al2O3/SiC composite sample was recorded with the help of Xpert-Pro Diffractometer with Cu K radiation. The data are measured at 1300oC and at a wavelength of 1.5420 nm. The diffraction peaks of sample D was observed at 2? values of angles 34.8, 35.6, 38.2, 54.3, 60.0 and 71.7 The XRD used to calculate the crystallite size (D) with the help of Scherrer’s relation.

(1)

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Where, k is the shape factor usually (k=0.94), ? is the X-ray wavelength, and ? is the Full Width at Half Maximum (FWHM) of all the peaks in XRD pattern and ? is the Bragg’s angle of the X-ray diffraction peak. The average crystallite sizes ware found to be 85 nm for 1300oC. Table 4 shows the XRD values of the processed composite. The high-intensity peak observed at 2? = 38.2255.Yong Ning et.al 26 prepared Al2O3-TI2SiC composite by the hot pressing technique with a different weight ratio of Al2O3.he has obtained strong peak ?= 38 o for 40% of aluminum oxide. In the present work, the same value and better crystalline nature obtained.
So it concluded that the TiB2 interacted with Al2O3/SiC structure.

Figure (6) XRD Observations of 20wt% TiB2 /Al2O3/SiC at 1300 oC

Table 4. Diffraction peaks of 20wt% TiB2 /Al2O3/SiC at 1300 oC

Pos. °2Th.

Height cuts

FWHM Left °2Th.

d-spacing Å

Rel. Int. %

34.8555

32.15

0.1476

2.57405

29.41

35.6227

86.35

0.1968

2.52036

78.99

38.2255

109.32

0.1476

2.35452

100.00

54.3916

14.03

0.7872

1.68683

12.83

60.0078

49.37

0.1968

1.54169

45.16

71.7782

95.88

0.1476

1.31510

87.71